What calibration equipment is available for 2D force sensors?
Release Time:
2025-11-01
The force calibration equipment for two-dimensional force sensors consists of various force-measuring weights. The national standard force measurement device, on the other hand, is a stationary reference force machine. China’s 100 tf (ton-force) standard force measurement facility is installed at the branch institute of the National Institute of Metrology in Dayi County, Sichuan Province. In practice, the reference force machine comprises a set of directly loaded weights—static weight standards—that accurately represent the reference force value within the gravitational field. In addition to using a lever amplification system and dial indicators for readings, an optical microscope is also employed to measure the deformation of the force-measuring ring, serving as the primary standard force gauge. If a laser interferometer is used to precisely measure the deformation of the standard force ring, and the resulting data is processed by a microcomputer to directly calculate the force value, the accuracy can be significantly enhanced.
Different types of sensors require different calibration equipment. Even for the same sensor model, if it has varying precision requirements, the corresponding calibration devices will also differ. Sensor calibration technology is continuously advancing, leading to the emergence of new calibration tools. These devices are primarily used to determine a sensor's conversion characteristics. For instance, a piezoelectric pressure sensor generates an electrical charge output when subjected to pressure—essentially converting the pressure signal into an electrical charge. However, the exact amount of pressure needed to produce a specific charge level cannot be determined by the sensor itself; instead, it relies on specialized equipment. The process of using such dedicated tools to establish this conversion relationship is called calibration, a concept known in metrology as "setting," where standard instruments are employed to define the input-to-output relationship of the sensor.
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